Application of IR ellipsometry to determination of the film thickness of a polytetrafluoroethylene sample modified in direct-current discharge К списку публикаций
Makeev, M.O. , Ivanov, Yu.A., Meshkov, S.A., Gil’Man, A.B., Yablokov, M.Yu.
Bauman State Technical University, Moscow, Russian Federation
Enikolopov Institute of Synthetic Polymer Materials, Russian Academy of Sciences, Moscow, Russian Federation
High Energy Chemistry
Volume 45, Issue 6, November 2011, Pages 536-538